Strain in Epitaxial Bi2Se3 grown on GaN and Graphene Substrates: A Reflection High-Energy Electron Diffraction Study
| Title | Strain in Epitaxial Bi2Se3 grown on GaN and Graphene Substrates: A Reflection High-Energy Electron Diffraction Study |
| Publication Type | Journal Article |
| Year of Publication | 2015 |
| Authors | Li, Bin, Guo Xin, Ho Wingkin, and Xie Maohai |
| Journal | Appl. Phys. Lett. |
| Volume | 107 |
| DOI | http://dx.doi.org/10.1063/1.4929697 |